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Data retention | Fatigue | Data retention after fatigue | Results of product reliability tests |
FUJITSU FRAM Quality & Reliability
Reliability(4/4)
Results of product reliability tests
Results of reliability tests on product units are shown in Tables 5 and 6.
Table 5. Endurance tests
| Test item | Test condition | Test hours | No. of tests | No. of failed units |
| High Temperature Storage | Ta=150°C | 1kh | 46 | 0 |
| High Temperature Operating Life | Ta=125°C | 1kh | 77 | 0 |
| Temperature Humidity Bias | Ta=85°C, 85%RH | 1kh | 46 | 0 |
| Low Temperature Operating Life | Ta=-55°C | 1kh | 26 | 0 |
Notes:
High Temperature Operating Life : No. of tests
Temperature Humidity Bias : No. of tests
- Pre-treatment : Baking (125°C, 24h) + (Moisture Absorption (85°C/85%RH, 12h) + IR Reflow 240°C MAX.) x 2 times
High Temperature Operating Life
Temperature Humidity Bias
Low Temperature Operating Life
- Conditions for operation with alternative currents: power supply voltage of 6.0 V, input frequency of 1 MHz
Table 6. Environmental tests
| Test item | Test condition | No. of tests | No. of failed units |
| Temperature Cycling | Ta=-65°C-150°C (200cyc) 1 | 8 | 0 |
| Thermal Shock | Ta=0°C-100°C (200cyc) 1 | 11 | 0 |
| Pressure Cooker Test | Ta=121°C, 100%RH: 2.03 x 10EXP5 Pa (168h) | 18 | 0 |
| Pressure Cooker Test with Bias | Ta=121°C, 100%RH: 2.03 x 10EXP5 Pa (96h) | 11 | 0 |
Notes:
Temperature Cycling : No. of tests
Pressure Cooker Test : No. of tests
- Pre-treatment : Baking (125°C, 24h) + (Moisture Absorption (85°C/85%RH, 12h) + IR Reflow 240°C MAX.) x 2 times
Pressure Cooker Test with Bias
- Pressure Cooker Test with Bias operating conditions: power supply voltage of 6.0 V
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